Description
Open Short Test
Function Test
USB2.0
OS测试板(test board)是一种open/short测试仪。
可以施加电压于模组控制器，这是HyVISION SYSTEM独有的世界首款产品。
该产品支持测试功能，也可以按用户需求定制。
| Item | Description |
| Model | HyCNT_OS Tester |
| OS test | Quantity of test pin : 16Pin |
| Source : Constant Current (1uA ~ 1000uA : 10uA step, 1mA~30mA : 100uA step) Adjustable Compliance voltage 1.5V ~ 3.3V (0.1V step) | |
| Measure : Voltage (0V ~ 3.3V, 1024step) | |
| Test method : Pin to Pin Short Test | |
| Function Test | Rising voltage measure : Test on SMU, refer to the requirement |
| VDD(common drein voltage) current measure : 0~4mA (1uA step) refer to the requirement | |
| Status pin Test : refer to the requirement | |
| I2C | up to 400Khz, available bulk mode/128Byte |
| PC Interface | USB2.0 |
| Input Power | DC 12.0V / 2A |
| Dimension | 134 x 84 x 22 mm (WHD, TBD) |
Open Short Test
Function Test
USB2.0
OS测试板(test board)是一种open/short测试仪。
可以施加电压于模组控制器，这是HyVISION SYSTEM独有的世界首款产品。
该产品支持测试功能，也可以按用户需求定制。
| Item | Description |
| Model | HyCNT_OS Tester |
| OS test | Quantity of test pin : 16Pin |
| Source : Constant Current (1uA ~ 1000uA : 10uA step, 1mA~30mA : 100uA step) Adjustable Compliance voltage 1.5V ~ 3.3V (0.1V step) | |
| Measure : Voltage (0V ~ 3.3V, 1024step) | |
| Test method : Pin to Pin Short Test | |
| Function Test | Rising voltage measure : Test on SMU, refer to the requirement |
| VDD(common drein voltage) current measure : 0~4mA (1uA step) refer to the requirement | |
| Status pin Test : refer to the requirement | |
| I2C | up to 400Khz, available bulk mode/128Byte |
| PC Interface | USB2.0 |
| Input Power | DC 12.0V / 2A |
| Dimension | 134 x 84 x 22 mm (WHD, TBD) |
